Effect of Electron Shading on Gate Oxide Degradation
Sakamori, Shigenori, Maruyama, Takahiro, Fujiwara, Nobuo, Miyatake, HiroshiVolume:
37
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.2321
Date:
April, 1998
File:
PDF, 1.10 MB
english, 1998