Distribution Profiles of B Atoms in Diborane Implanted Silicon Prepared Using an Ion Implantor without Mass Filters
Yokota, Katsuhiro, Nakamura, Kazuhiro, Nishimura, Hidetoshi, Terada, Kouichiro, Sakai, Shigeki, Tanjou, Masayasu, Takano, Hiromichi, Kumagaya, MasaoVolume:
38
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.38.4953
Date:
September, 1999
File:
PDF, 423 KB
english, 1999