Simulation of Temperature Dependence of Microwave Noise in...

Japanese Journal of Applied Physics 2000 / 4 Vol. 39; Iss. Part 1, No

Simulation of Temperature Dependence of Microwave Noise in Metal-Oxide-Semiconductor Field-Effect Transistors

Obrecht, Michael S., Manku, Tajinder, Elmasry, Mohamed I.
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Volume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.39.1690
Date:
April, 2000
File:
PDF, 1.26 MB
english, 2000
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