Generalized Grazing Incidence-Angle X-Ray Diffraction...

Japanese Journal of Applied Physics 2000 / 7 Vol. 39; Iss. Part 1, No

Generalized Grazing Incidence-Angle X-Ray Diffraction Studies on InAs Quantum Dots on Si (100) Substrates

Uragami, Takeshi, Fujioka, Hiroshi, Waki, Ichitaro, Mano, Takaaki, Ono, Kanta, Oshima, Masaharu, Takagi, Yasuo, Kimura, Masao, Suzuki, Tamaki
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Volume:
39
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.39.4483
Date:
July, 2000
File:
PDF, 256 KB
2000
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