Effects of Defects in SiO 2...

Japanese Journal of Applied Physics 2006 / 8 Vol. 45; Iss. No. 31

Effects of Defects in SiO 2 Thin Films Prepared on Polyethylene Terephthalate by High-Temperature E-beam Deposition

Han, Jin-Woo, Kang, Hee-Jin, Kim, Jong-Hwan, Seo, Dae-Shik
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Volume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.45.L827
Date:
August, 2006
File:
PDF, 255 KB
english, 2006
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