Direct Measurement of Transfer Functions in Kelvin Probe...

Japanese Journal of Applied Physics 2008 / 7 Vol. 47; Iss. 7

Direct Measurement of Transfer Functions in Kelvin Probe Force Microscopy Using Artificially Patterned Surface Potentials

Ozasa, Kazunari, Nemoto, Shigeyuki, Isoshima, Takashi, Ito, Eisuke, Maeda, Mizuo, Hara, Masahiko
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Volume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.5630
Date:
July, 2008
File:
PDF, 339 KB
english, 2008
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