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Synchrotron-Based X-ray Spectroscopic Investigation of Nitrogen-Doped Ge–Bi (8.4 at. %)–Te Thin Films during the Amorphous-to-Crystalline Structural Phase Transition
Kim, Kihong, Jung, M.-C., Park, Ju Chul, Choi, Sang Jun, Shin, Hyun-JoonVolume:
49
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.49.072601
Date:
July, 2010
File:
PDF, 829 KB
english, 2010