Experimental Evidence for Involvement of Interface States...

Japanese Journal of Applied Physics 2012 / 9 Vol. 51

Experimental Evidence for Involvement of Interface States in Random Telegraph Noise in Junction Leakage Current of Metal–Oxide–Semiconductor Field-Effect Transistor

Mori, Yuki, Shima, Akio, Takeda, Kenichi, Yamada, Ren-ichi
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Volume:
51
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.51.104101
Date:
September, 2012
File:
PDF, 266 KB
english, 2012
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