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Critical behavior study of ferroelectric semiconductors (PbxSn1-x)2P2S6 from thermal diffusivity measurements
Shvalya, V., Oleaga, A., Salazar, A., Kohutych, A.A., Vysochanskii, Yu.M.Language:
english
Journal:
Thermochimica Acta
DOI:
10.1016/j.tca.2015.08.031
Date:
August, 2015
File:
PDF, 4.26 MB
english, 2015