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Influence of the electron thermal conductivity on the threshold and dynamics of the breakdown of insulators containing microinclusions
Anisimov, Sergei I, Gal'burt, V A, Tribel'skiĭ, M IVolume:
11
Language:
english
Journal:
Soviet Journal of Quantum Electronics
DOI:
10.1070/QE1981v011n08ABEH008033
Date:
August, 1981
File:
PDF, 258 KB
english, 1981