Time-of-flight photoelectron emission microscopy TOF-PEEM:...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1998 Vol. 406; Iss. 3

Time-of-flight photoelectron emission microscopy TOF-PEEM: first results

H Spiecker, O Schmidt, Ch Ziethen, D Menke, U Kleineberg, R.C Ahuja, M Merkel, U Heinzmann, G Schönhense
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Volume:
406
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0168-9002(97)01215-1
File:
PDF, 747 KB
english, 1998
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