[IEEE 2014 32nd IEEE International Conference on Computer Design (ICCD) - Seoul, South Korea (2014.10.19-2014.10.22)] 2014 IEEE 32nd International Conference on Computer Design (ICCD) - Chip clustering with mutual information on multiple clock tests and its application to yield tuning
Chiang, Jiun-Yi, Kuo, Jun-Hua, Hsu, Ting-Shuo, Liou, Jing-JiaYear:
2014
Language:
english
DOI:
10.1109/ICCD.2014.6974688
File:
PDF, 1.77 MB
english, 2014