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[IEEE 2015 16th Latin-American Test Symposium (LATS) - Puerto Vallarta, Mexico (2015.3.25-2015.3.27)] 2015 16th Latin-American Test Symposium (LATS) - Virtual reconfigurable scan-chains on FPGAs for optimized board test
Aleksejev, Igor, Devadze, Sergei, Jutman, Artur, Shibin, KonstantinYear:
2015
Language:
english
DOI:
10.1109/LATW.2015.7102411
File:
PDF, 525 KB
english, 2015