[IEEE 2015 Symposium on VLSI Technology - Kyoto, Japan (2015.6.16-2015.6.18)] 2015 Symposium on VLSI Technology (VLSI Technology) - High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology
Giles, M. D., Arkali Radhakrishna, N., Becher, D., Kornfeld, A., Maurice, K., Mudanai, S., Natarajan, S., Newman, P., Packan, P., Rakshit, T.Year:
2015
Language:
english
DOI:
10.1109/VLSIT.2015.7223657
File:
PDF, 208 KB
english, 2015