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SPIE Proceedings [SPIE Optics East 2007 - Boston, MA (Sunday 9 September 2007)] Wavelet Applications in Industrial Processing V - Detecting trace components in liquid chromatography/mass spectrometry data sets with two-dimensional wavelets
Compton, Duane C., Snapp, Robert R., Truchetet, Frédéric, Laligant, OlivierVolume:
6763
Year:
2007
Language:
english
DOI:
10.1117/12.732910
File:
PDF, 1.14 MB
english, 2007