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Negative Resistance of Si(Li) Detectors Irradiated by Energetic Electrons
Nakamoto, Shunsuke, Aoki, Takashi, Kawabata, KeishiVolume:
12
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.12.322
Date:
February, 1973
File:
PDF, 2.70 MB
english, 1973