Schottky Contact Characterization of Sputter-Etched Surface...

Japanese Journal of Applied Physics 1979 / 9 Vol. 18; Iss. 9

Schottky Contact Characterization of Sputter-Etched Surface of GaAs and Its Recovery by Annealing

Suzuki, Norio, Kataoka, Hisashi, Hariu, Takasi, Shibata, Yukio
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Volume:
18
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.18.1879
Date:
September, 1979
File:
PDF, 223 KB
1979
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