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Moisture Induced Failures in Plastic Encapsulated 64 kbit Dynamic RAM's
Satoh, Yoshihiro, Iwamori, Kiyoshi, Sawada, Kokichi, Miyamoto, Kazutoshi, Matsumoto, HeihachiVolume:
23
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.23.L274
Date:
May, 1984
File:
PDF, 410 KB
english, 1984