Electron Mobility in Si Inversion Layers
Masaki, Kazuo, Hamaguchi, Chihiro, Taniguchi, Kenji, Iwase, MasaoVolume:
28
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.28.1856
Date:
October, 1989
File:
PDF, 1.24 MB
1989