Study of Si 3 N 4 /SiO 2 /Si and SiO 2 /Si 3 N 4 /Si Multilayers by O and N K-Edge X-ray Absorption Spectroscopy
Lee, Youn-Seoung, Lee, Won-Jun, Kang, Sung-Kyu, Rha, Sa-KyunVolume:
49
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.49.08JF05
Date:
August, 2010
File:
PDF, 193 KB
english, 2010