![](/img/cover-not-exists.png)
Admittance Measurement for a Quantum Point Contact in a Multiterminal Quantum Hall Device
Washio, Kazuhisa, Hashisaka, Masayuki, Kamata, Hiroshi, Muraki, Koji, Fujisawa, ToshimasaVolume:
50
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.04DJ04
Date:
April, 2011
File:
PDF, 374 KB
english, 2011