![](/img/cover-not-exists.png)
[IEEE 2015 American Control Conference (ACC) - Chicago, IL, USA (2015.7.1-2015.7.3)] 2015 American Control Conference (ACC) - Pattern recognition technique based active set QP strategy applied to MPC for a driving cycle test
Zhu, Qilun, Onori, Simona, Prucka, RobertYear:
2015
Language:
english
DOI:
10.1109/ACC.2015.7172107
File:
PDF, 468 KB
english, 2015