SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Window and Dome Technologies and Materials VI - Direct emissivity measurements of IR materials
Kisler, Yanina, Kupferberg, Lenn C., Mackenzie, Gordon, Chen, Chia M., Tustison, Randal W.Volume:
3705
Year:
1999
Language:
english
DOI:
10.1117/12.354636
File:
PDF, 334 KB
english, 1999