The characterization of undulator radiation at MAXII using...

The characterization of undulator radiation at MAXII using a soft X-ray fluorescence spectrometer

J.-H. Guo, S.M. Butorin, C. Såthe, J. Nordgren, M. Bässler, R. Feifel, S. Werin, M. Georgsson, A. Åndersson, M. Jurvansuu, R. Nyholm, M. Eriksson
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Volume:
431
Year:
1999
Language:
english
Pages:
9
DOI:
10.1016/s0168-9002(99)00182-5
File:
PDF, 407 KB
english, 1999
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