X-Ray and Electron Microscopic Study of a High Temperature...

Japanese Journal of Applied Physics 1987 / 4 Vol. 26; Iss. Part 2, No

X-Ray and Electron Microscopic Study of a High Temperature Superconductor Y 0.4 Ba 0.6 CuO 2.22

Syono, Yasuhiko, Kikuchi, Masae, Oh-ishi, Katsuyoshi, Hiraga, Kenji, Arai, Hide, Matsui, Yoshito, Kobayashi, Norio, Sasaoka, Takaaki, Muto, Yoshio
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Volume:
26
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.26.L498
Date:
April, 1987
File:
PDF, 3.04 MB
1987
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