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380 nm Photoluminescence Caused by Trace Na Impurity in High-Purity Synthetic Silica Glass
Shimbo, Masaru, Hagiwara, Hirotaka, Kimura, Yoshiko, Ariga, ShouzouVolume:
32
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.L671
Date:
May, 1993
File:
PDF, 280 KB
english, 1993