Effect of Electron Beam Irradiation on Si Surface Cleaning in Ultrahigh-Vacuum System
Miura, Hiroshi, Ohtaka, Kouichi, Shindo, DaisukeVolume:
34
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.34.L573
Date:
May, 1995
File:
PDF, 238 KB
english, 1995