Spatial Distributions of Individual Traps in a Si/SiO 2 Interface
Sakamoto, Toshitsugu, Kawaura, Hisao, Baba, ToshioVolume:
36
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.36.1380
Date:
March, 1997
File:
PDF, 285 KB
english, 1997