Spatial Distributions of Individual Traps in a Si/SiO...

Spatial Distributions of Individual Traps in a Si/SiO 2 Interface

Sakamoto, Toshitsugu, Kawaura, Hisao, Baba, Toshio
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Volume:
36
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.36.1380
Date:
March, 1997
File:
PDF, 285 KB
english, 1997
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