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Radio-Frequency Small-Signal and Noise Modeling for Silicon-on-Insulator Dynamic Threshold Voltage Metal–Oxide–Semiconductor Field-Effect Transistors
Wang, Sheng-Chun, Su, Pin, Chen, Kun-Ming, Huang, Sheng-Yi, Hung, Cheng-Chou, Huang, Guo-WeiVolume:
48
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.48.04C041
Date:
April, 2009
File:
PDF, 111 KB
english, 2009