Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1999 Vol. 434; Iss. 1
![](/img/cover-not-exists.png)
A transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon
D Alexiev, M.I Reinhard, L Mo, A RosenfeldVolume:
434
Year:
1999
Language:
english
Pages:
11
DOI:
10.1016/s0168-9002(99)00441-6
File:
PDF, 289 KB
english, 1999