A transient conductance technique for characterisation of...

A transient conductance technique for characterisation of deep-level defects in highly irradiated detector-grade silicon

D Alexiev, M.I Reinhard, L Mo, A Rosenfeld
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
434
Year:
1999
Language:
english
Pages:
11
DOI:
10.1016/s0168-9002(99)00441-6
File:
PDF, 289 KB
english, 1999
Conversion to is in progress
Conversion to is failed