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Transmission Electron Microscopy Observation of Reaction in Nanometer-scaled Au and Si Binary System
Ishiguro, Takashi, Shinbo, Takahiro, Shimanuki, JunichiVolume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.43.850
Date:
February, 2004
File:
PDF, 859 KB
english, 2004