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Two-Dimensional Carrier Profiling by Kelvin-Probe Force Microscopy
Tsui, Bing-Yue, Hsieh, Chih-Ming, Su, Po-Chih, Tzeng, Shien-Der, Gwo, ShangjrVolume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.47.4448
Date:
June, 2008
File:
PDF, 451 KB
english, 2008