Surface measurement of indium tin oxide thin film by...

Applied Optics 2015 / 08 Vol. 54; Iss. 23

Surface measurement of indium tin oxide thin film by wavelength-tuning Fizeau interferometry

Kim, Yangjin, Hibino, Kenichi, Sugita, Naohiko, Mitsuishi, Mamoru
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Volume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.54.007135
Date:
August, 2015
File:
PDF, 904 KB
english, 2015
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