X-ray photoelectron and Raman spectroscopy of...

Applied Surface Science 2000 Vol. 158; Iss. 3-4

X-ray photoelectron and Raman spectroscopy of nanocrystalline Ga0.62In0.38Sb–SiO2 composite films

Fa-Min Liu, Li-De Zhang, M.J Zheng, G.H Li
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Volume:
158
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(00)00022-2
File:
PDF, 140 KB
english, 2000
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