Quantum size effect in low energy electron diffraction of thin films
Altman, M.S., Chung, W.F., He, Z.Q., Poon, H.C., Tong, S.Y.Volume:
169-170
Language:
english
Pages:
6
Journal:
Applied Surface Science
DOI:
10.1016/s0169-4332(00)00644-9
Date:
January, 2001
File:
PDF, 290 KB
english, 2001