Barrier-height imaging of Cs-adsorbed Si(111)
Yoshikawa, Jun, Kurokawa, Shu, Sakai, AkiraVolume:
169-170
Language:
english
Pages:
4
Journal:
Applied Surface Science
DOI:
10.1016/s0169-4332(00)00651-6
Date:
January, 2001
File:
PDF, 440 KB
english, 2001