Aging effect of SiO2 xerogel film on its microstructure and dielectric properties
Kim, Jung-Ho, Kim, Hong-Ryul, Park, Hyung-Ho, Hyun, Sang-HoonVolume:
169-170
Language:
english
Pages:
5
Journal:
Applied Surface Science
DOI:
10.1016/s0169-4332(00)00702-9
Date:
January, 2001
File:
PDF, 745 KB
english, 2001