Initial oxidation process of Mg films characterized by AES,...

Applied Surface Science 2001 / 1 Vol. 169-170

Initial oxidation process of Mg films characterized by AES, EELS, and UPS

Nishita, K., Saiki, K., Koma, A.
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Volume:
169-170
Language:
english
Pages:
4
Journal:
Applied Surface Science
DOI:
10.1016/s0169-4332(00)00727-3
Date:
January, 2001
File:
PDF, 108 KB
english, 2001
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