Investigation of micro-adhesion by atomic force microscopy

Investigation of micro-adhesion by atomic force microscopy

Ouyang, Q., Ishida, K., Okada, K.
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Volume:
169-170
Language:
english
Pages:
5
Journal:
Applied Surface Science
DOI:
10.1016/s0169-4332(00)00804-7
Date:
January, 2001
File:
PDF, 119 KB
english, 2001
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