Auger electron spectroscopy investigations of the effect of degradation of depth resolution and its influence on the interdiffusion data in thin film Au/Ag, Cu/Ag, Pd/Au and Pd/Cu multilayer structures
A BukalukVolume:
175-176
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0169-4332(01)00070-8
File:
PDF, 117 KB
english, 2001