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On the origin of resonance features in reflectance difference data of silicon
K Hingerl, R.E Balderas-Navarro, A Bonanni, P Tichopadek, W.G SchmidtVolume:
175-176
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(01)00114-3
File:
PDF, 169 KB
english, 2001