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Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces
J. Pezoldt, Ch. Förster, P. Weih, P. MasriVolume:
184
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0169-4332(01)00480-9
File:
PDF, 97 KB
english, 2001