Spectroscopic ellipsometry of non-absorbing films...

Applied Surface Science 2002 Vol. 193; Iss. 1-4

Spectroscopic ellipsometry of non-absorbing films independent of film thickness

J.C Martı́nez-Antón, J.A Gómez-Pedrero
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Volume:
193
Year:
2002
Language:
english
Pages:
9
DOI:
10.1016/s0169-4332(02)00494-4
File:
PDF, 203 KB
english, 2002
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