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TOF-SIMS characterization of industrial materials: from silicon wafer to polymer
Akiya Karen, Naoki Man, Takahiro Shibamori, Kumiko TakahashiVolume:
203-204
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(02)00623-2
File:
PDF, 141 KB
english, 2003