Estimation of ToF-SIMS information depth in micro-corrosion...

Applied Surface Science 2003 Vol. 203-204; Iss. none

Estimation of ToF-SIMS information depth in micro-corrosion analysis

Yoshimi Abe, Manabu Komatsu, Hidekazu Okuhira
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Volume:
203-204
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(02)00824-3
File:
PDF, 223 KB
english, 2003
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