X-ray diffraction and electrical characterization of...

X-ray diffraction and electrical characterization of photo-CVD zirconium oxide layers

J.J. Yu, I.W. Boyd
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Volume:
208-209
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(02)01406-x
File:
PDF, 96 KB
english, 2003
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