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Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe
L. Johann, A. En Naciri, L. Broch, V. Demange, J. Ghambaja, F. Machizaud, J.M. DuboisVolume:
207
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(02)01504-0
File:
PDF, 179 KB
english, 2003