New intrinsic pair defects in silicon dioxide interface

New intrinsic pair defects in silicon dioxide interface

Isao Kitagawa, Takuya Maruizumi
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Volume:
216
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(03)00379-9
File:
PDF, 263 KB
english, 2003
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