Compositional transition layer in SiO2/Si interface...

Compositional transition layer in SiO2/Si interface observed by high-resolution RBS

Kenji Kimura, Kaoru Nakajima
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Volume:
216
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0169-4332(03)00386-6
File:
PDF, 97 KB
english, 2003
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