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Effect of substrate bias on SE, XPS and XAES studies of diamond-like carbon films deposited by saddle field fast atom beam source
Rajnish Sharma, O.S. Panwar, Sushil Kumar, D. Sarangi, A. Goullet, P.N. Dixit, R. BhattacharyyaVolume:
220
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0169-4332(03)00828-6
File:
PDF, 173 KB
english, 2003